Description
Take your measurements to the limit of detection with the 2nd generation of 1-nm particle sizing. For more than 30 years, TSI’s SMPS spectrometers have been widely used as the standard for measuring aerosol size distributions in the submicrometer and low nanometer size range. With the addition of the Nano Enhancer Model 3757 and Differential Mobility Analyzer Model 3086, one can now measure the size and number concentration with high resolution and speed, and monitor reaction kinetics and new particle formation of engineered and natural aerosol particles as small as 1 nm.
